Successive ionic layer adsorption and reaction (SILAR) technique was used to prepare (CdS) thin films on glass substrate, by changing the immersion time in thiourea solution. XRD patterns proved that the as deposited thin films were polycrystalline structure with an average crystallite size ranging from 14.1 nm to 5.6 nm depending on immersion time. The EDX confirm the existence of CdS. Scanning electron microscopy reveals that the deposited films have a nanorod structure.Atomic force microscopy has shown that the values of average roughness and the root mean square roughness increase upon increasing the immersion time. The transmittance spectra reveal that as the immersion time increase, the value of transmittance decrease.
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