ABSTRACT
Tungsten powder particles have been encapsulated with thin CrMnFeCoNi layers by magnetron sputtering method using high entropy alloy as a target. In the course of sputtering the powder surface has been periodically analyzed. The multimetallic coatings were being dissolved in 2 M HCl and the obtained solutions were analyzed by ICP method to determine Cr3+, Mn2+, Fe2+, Co2+ and Ni2+ ions concentration. The aim of the analysis was comparison of atomic proportions of the elements in the target and in obtained layer and indirect determining of the layer thickness.
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