TiO2-ZnO thin films have been prepared by using drop casting technique. The optical, structural, and morphological properties of nanostructured TiO2-ZnO thin films deposited by drop casting technique was studied by using several experimental techniques were used to characterize optical, structural, and morphological properties; X-Ray Diffraction (XRD) was used to study the crystal structures, the crystallite size, the dislocation density, and the number of crystallites per unit area of TiO2-ZnO thin films. The surface topography, surface roughness parameters, and average grain size for all samples were done by Atomic Force Microscopy (AFM) micrograph which confirm the existence of Nano-structured thin films. The optical energy gap of the TiO2-ZnO thin films was determined by using UV spectroscopy. It was found that one type of basic electrons transitions, through which the values of the optical energy gap for all the prepared thin films which are allowed direct transition.
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