The fitting of a probability distribution to the lifetime and temperature of black holes existing in X-Ray binaries based on some generalized extreme value distributions (Weibull, Gumbel and Frechet), along with the Normal, Cauchy and Logistic distributions, is considered to determine the best fit in assessing the temperature and lifetime potential of the black holes. The calculated lifetime (in years) and temperature (in Kelvins) for different test black holes are obtained from Prakash et al. (2013). The maximum likelihood method is used to estimate the unknown parameters of the distributions. By making use of the Kolmogorov-Smirnov (K-S) statistic and some other information criteria, the results show that the lifetime data best fits into Weibull distribution while Gumbel distribution best fits the temperature data compared to the Normal, Cauchy and Logistic distributions.
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