ABSTRACT
Zinc oxide thin films was deposited by chemical spray pyrolysis (CSP) at 400 °C substrate
temperature and different thickness (60, 80, and 100) nm on the texturized p-Si wafer to fabricate
ZnO/p-Si heterojunction solar cell. Structural, optical, electrical and photovoltaic properties are
investigated for the samples. XRD analysis reveals that all the as deposited ZnO films show
polycrystalline structure, without any change due to increase of thickness. Average diameter
calculated from AFM images shows an increase in its value with increasing thickness, ranging from
59.82-95.7 nm. The optical reflections for samples are measured using UV-Vis spectrophotometer.
Photoluminescence (PL) spectra of (CSP) grown ZnO/p-Si with different thickness were used to study
the energy gap. The electrical properties of heterojunction were obtained by I-V (dark and illuminated)
and C-V measurement. I-V characteristic of the ZnO/p-Si heterojunction shows good rectifying
behavior under dark condition. The ideality factor and the saturation current density was calculated.
Under illuminated the photovoltaic measurements (open-circuit voltage (Voc), short-circuit current
density (JSC), fill factor (FF), and quantum efficiencies are calculated for all samples. The built- in
potential (Vbi), carrier concentration and depletion width are determined under different thickness from
C-V measurement.
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