Abstract
CdSe: 1% Ag thin films prepared by thermal evaporation method on glass substrates under vacuum technique with rate of deposition equal to 50 nm/min, the deposited films thickness (1µm) on glass substrates have been annealed at different temperatures for one hour. XRD measurement shows that the films have polycrystalline structure at R.T and change to single crystalline when annealed these films for different annealing temperatures (423, 473, 523 K). The optical measurement indicated that CdSe: 1% Ag films have direct optical energy gap, and it decreases with increasing annealing temperatures. The optical constant refractive index, extinction coefficient and dielectric constants were also studied.
References
Support the magazine and subscribe to the content
This is premium stuff. Subscribe to read the entire article.
